CINS

CENTER FOR INTEGRATED NANOSYSTEMS

 

Center for Integrated Nanosystem is equipped with various instruments used for nanofabrication and material characterization. These instruments include the following,

  • FEI Focused Ion Beam SEM V600-Series with EDAX
  • Lakeshore Vibrating Sample Magnetometer (VSM) Model 7300
  • Oxford Instruments MagLab VSM
  • Princeton Measurements Corp. Micromag Model 2900 -Alternating Force Grade Magnetometer
  • Custom Built Magneto Optic Kerr Effect (MOKE) System
  • Veeco 3 cm RF Source Ion Mill
  • Custom built Ion Beam Lithography Tool
  • Custom Built Sputtering System
  • Custom Built Etching System
  • Custom Built Evaporation Chamber